1

Diffusion characteristics of boron and phosphorus in polycrystalline silicon

A.D. Buonaquisti, W. Carter, P.H. Holloway
Journal:
Thin Solid Films
Year:
1983
Language:
english
File:
PDF, 613 KB
english, 1983
2

Digital Imaging for TEM - Part III Characterizing Digital Images

Buonaquisti, Anthony D.
Journal:
Microscopy Today
Year:
1995
Language:
english
File:
PDF, 3.66 MB
english, 1995
3

Energy Distribution of Electrons Emitted from MIM Thin-Film Sandwich Cathodes

A. D. Buonaquisti, R. A. Collins
Journal:
physica status solidi (a)
Year:
1978
Language:
english
File:
PDF, 141 KB
english, 1978
4

Metal contacts to CuInSe2

R.J. Matson, O. Jamjoum, A.D. Buonaquisti, P.E. Russell, L.L. Kazmerski, P. Sheldon, R.K. Ahrenkiel
Journal:
Solar Cells
Year:
1984
Language:
english
File:
PDF, 368 KB
english, 1984
6

Radiation damage and annealing studies of ion-implanted aluminium

Buonaquisti, A. D., Collins, R. A., Dearnaley, G.
Journal:
Radiation Effects
Year:
1982
Language:
english
File:
PDF, 443 KB
english, 1982
8

If You Hate Vacuum Systems Read On

Buonaquisti, Anthony
Journal:
Microscopy Today
Year:
1993
Language:
english
File:
PDF, 4.13 MB
english, 1993
9

Digital Imaging For TEM

Buonaquisti, Anthony D.
Journal:
Microscopy Today
Year:
1994
Language:
english
File:
PDF, 4.20 MB
english, 1994
10

Scanning electron beam submicron analytical techniques

A.D. Buonaquisti, P.E. Russell
Journal:
Ultramicroscopy
Year:
1988
Language:
english
File:
PDF, 1.16 MB
english, 1988
13

Magnetron sputtered gold contacts on n-GaAs

A. D. Buonaquisti, R. J. Matson, P. E. Russell, P. H. Holloway
Journal:
Surface and Interface Analysis
Year:
1984
Language:
english
File:
PDF, 287 KB
english, 1984
14

Interfacial chemistry of electrical contacts on GaAs and Al0.3Ga0.7As

A. D. Buonaquisti
Year:
1983
Language:
english
File:
PDF, 645 KB
english, 1983
15

Why Pressure Scales Cause So Much Confusion

Buonaquisti, Anthony D.
Journal:
Microscopy Today
Year:
1993
Language:
english
File:
PDF, 3.70 MB
english, 1993
16

Why Pressure Scales Cause So Much Confusion

Buonaquisti, Anthony D.
Journal:
Microscopy Today
Year:
2001
Language:
english
File:
PDF, 3.96 MB
english, 2001